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RETRACTED ARTICLE: Structural, optical and electrical characterization of vacuum-evaporated nanocrystalline CdSe thin films for photosensor applications

Crossref DOI link: https://doi.org/10.1007/s00339-016-0502-0

Published Online: 2016-10-18

Published Print: 2016-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Kumar, Vipin

Sharma, D. K.

Sharma, Kapil

Dwivedi, D. K.
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Text and Data Mining valid from 2016-10-18

Version of Record valid from 2016-10-18
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Article History

Received: 19 July 2016

Accepted: 12 October 2016

First Online: 18 October 2016

Change Date: 26 June 2025

Change Type: Correction

Change Details: This article has been retracted. Please see the Retraction Notice for more detail:

Change Details: https://doi.org/10.1007/s00339-025-08712-7

Retraction Retraction dated 2025-06-26

Click to view Retraction: https://doi.org/10.1007/s00339-025-08712-7