Pigment particles analysis with a total reflection X-ray fluorescence spectrometer: study of influence of instrumental parameters
Crossref DOI link: https://doi.org/10.1007/s00339-016-0581-y
Published Online: 2016-11-26
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Coccato, Alessia http://orcid.org/0000-0002-6641-2820
Vekemans, Bart
Vincze, Laszlo
Moens, Luc
Vandenabeele, Peter
Funding for this research was provided by:
Universiteit Gent (GOA)
License valid from 2016-11-26