Crossmark

Strain-induced modification in microstructure and electrical properties of polycrystalline LaNiO3−δ films

Crossref DOI link: https://doi.org/10.1007/s00339-016-9955-4

Published Online: 2016-03-14

Published Print: 2016-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Zhu, M. W.

Wang, H. L.

Lei, H.

Zhang, Y. J.

Jia, N.

Wang, Z. J.
Funding

Funding for this research was provided by:

National Natural Science Foundation of China (51202256, 51571057)

Chinese Ministry of Education (CN) (NCET-13-0104)
License Information

Text and Data Mining valid from 2016-03-14