Microstructure and conduction behavior of BiFeO3 thin film deposited on Ge-doped ZnO
Crossref DOI link: https://doi.org/10.1007/s00339-017-0773-0
Published Online: 2017-02-06
Published Print: 2017-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Raghavan, Chinnambedu Murugesan
Choi, Ji Ya
Kim, Sang Su
Funding for this research was provided by:
Ministry of Education (2010-0029634)
License valid from 2017-02-01