Electrical instability of InGaZnO thin-film transistors with and without titanium sub-oxide layer under light illumination
Crossref DOI link: https://doi.org/10.1007/s00339-017-0831-7
Published Online: 2017-02-24
Published Print: 2017-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chiu, Y. C.
Zheng, Z. W.
Cheng, C. H.
Chen, P. C.
Yen, S. S.
Fan, C. C.
Hsu, H. H.
Kao, H. L.
Chang, C. Y.
Funding for this research was provided by:
National Science Council
License valid from 2017-02-24