Thickness uniformity and optical/structural evaluation of RF sputtered ZnO thin films for solar cell and other device applications
Crossref DOI link: https://doi.org/10.1007/s00339-017-0909-2
Published Online: 2017-03-27
Published Print: 2017-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ortiz, Thiara
Conde, Crystal
Khan, Taj M.
Hussain, Babar http://orcid.org/0000-0001-7442-9537
License valid from 2017-03-27