Nonlinear behavior of microwave semiconductor materials measured under a strong electromagnetic environment using a compressed rectangular resonant cavity
Crossref DOI link: https://doi.org/10.1007/s00339-017-1025-z
Published Online: 2017-05-16
Published Print: 2017-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Li, E. http://orcid.org/0000-0002-9440-6161
Gao, Y.
Zhang, Y.
Gao, C.
Zheng, H.
Zeng, Z.
Funding for this research was provided by:
National Natural Science Foundation of China (61671123, 61001027)
License valid from 2017-05-16