Effects of thermal oxidation duration on the structural and electrical properties of Nd2O3/Si system
Crossref DOI link: https://doi.org/10.1007/s00339-017-1122-z
Published Online: 2017-07-10
Published Print: 2017-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hetherin, Karuppiah
Ramesh, S.
Wong, Yew Hoong http://orcid.org/0000-0003-3254-9420
Funding for this research was provided by:
Ministry of Higher Education, Malaysia (FRGS/1/2016/STG07/UM/02/6)
Universiti Malaya (PG028-2015A)
License valid from 2017-07-10