Performance of Erbium-doped TiO2 thin film grown by physical vapor deposition technique
Crossref DOI link: https://doi.org/10.1007/s00339-017-1180-2
Published Online: 2017-08-08
Published Print: 2017-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lahiri, Rini
Ghosh, Anupam
Dwivedi, Shyam Murli Manohar Dhar
Chakrabartty, Shubhro
Chinnamuthu, P.
Mondal, Aniruddha
License valid from 2017-08-08