Interface traps contribution on transport mechanisms under illumination in metal–oxide–semiconductor structures based on silicon nanocrystals
Crossref DOI link: https://doi.org/10.1007/s00339-017-1533-x
Published Online: 2018-01-10
Published Print: 2018-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chatbouri, S.
Troudi, M.
Kalboussi, A.
Souifi, A.
Text and Data Mining valid from 2018-01-10
Article History
Received: 12 April 2017
Accepted: 28 December 2017
First Online: 10 January 2018