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Measurement of semi-polar (11–22) plane AlN/GaN heterojunction band offsets by X-ray photoelectron spectroscopy

Crossref DOI link: https://doi.org/10.1007/s00339-018-1561-1

Published Online: 2018-01-13

Published Print: 2018-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Zhao, Guijuan

Li, Huijie

Wang, Lianshan

Meng, Yulin

Li, Fangzheng

Wei, Hongyuan

Yang, Shaoyan

Wang, Zhanguo
Funding

Funding for this research was provided by:

National Key Research and Development Program of China (2017YFB0404203)

National Natural Science Foundation of China (61774142 and 61504129)
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Article History

Received: 26 June 2017

Accepted: 8 January 2018

First Online: 13 January 2018