Electroforming-free TaOx memristors using focused ion beam irradiations
Crossref DOI link: https://doi.org/10.1007/s00339-018-2041-3
Published Online: 2018-08-20
Published Print: 2018-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Pacheco, J. L.
Perry, D. L.
Hughart, D. R.
Marinella, M.
Bielejec, E.
Text and Data Mining valid from 2018-08-20
Article History
Received: 24 March 2018
Accepted: 11 August 2018
First Online: 20 August 2018