Effects of single-pulse Al2O3 insertion in TiO2 oxide memristors by low temperature ALD
Crossref DOI link: https://doi.org/10.1007/s00339-018-2112-5
Published Online: 2018-09-14
Published Print: 2018-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Giovinazzo, C.
Ricciardi, C.
Pirri, C. F.
Chiolerio, A.
Porro, S.
Text and Data Mining valid from 2018-09-14
Article History
Received: 10 April 2018
Accepted: 12 September 2018
First Online: 14 September 2018