Low-frequency noise analysis of heterojunction SELBOX TFET
Crossref DOI link: https://doi.org/10.1007/s00339-018-2264-3
Published Online: 2018-11-22
Published Print: 2018-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ghosh, P.
Bhowmick, B.
Text and Data Mining valid from 2018-11-22
Article History
Received: 9 August 2018
Accepted: 17 November 2018
First Online: 22 November 2018