Fractal and multifractal analysis of In-doped ZnO thin films deposited on glass, ITO, and silicon substrates
Crossref DOI link: https://doi.org/10.1007/s00339-019-2398-y
Published Online: 2019-01-12
Published Print: 2019-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ghosh, Koushik http://orcid.org/0000-0002-3208-1015
Pandey, R. K.
Text and Data Mining valid from 2019-01-12
Article History
Received: 13 November 2018
Accepted: 9 January 2019
First Online: 12 January 2019