Study of Ga+ implantation in Si diodes: effect on optoelectronic properties using micro-spectroscopy
Crossref DOI link: https://doi.org/10.1007/s00339-019-2467-2
Published Online: 2019-02-14
Published Print: 2019-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Deshpande, Preeti
Vilayurganapathy, Subramanian
Bhat, K. N.
Ghosh, Ambarish
Text and Data Mining valid from 2019-02-14
Article History
Received: 28 August 2018
Accepted: 30 January 2019
First Online: 14 February 2019