Temperature sensitivity analysis of vertical tunneling based dual metal Gate TFET on analog/RF FOMs
Crossref DOI link: https://doi.org/10.1007/s00339-019-2621-x
Published Online: 2019-04-10
Published Print: 2019-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Paras, Neha http://orcid.org/0000-0002-0814-088X
Chauhan, Sudakar Singh
Text and Data Mining valid from 2019-04-10
Version of Record valid from 2019-04-10
Article History
Received: 19 November 2018
Accepted: 6 April 2019
First Online: 10 April 2019