Optical characterization of Ag-doped Ge–Se semiconducting thin films for optoelectronic applications
Crossref DOI link: https://doi.org/10.1007/s00339-019-2895-z
Published Online: 2019-08-05
Published Print: 2019-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mahmoud, A. Z.
Mohamed, Mansour
Text and Data Mining valid from 2019-08-05
Version of Record valid from 2019-08-05
Article History
Received: 18 June 2019
Accepted: 31 July 2019
First Online: 5 August 2019