Rietveld refinement of X-ray diffraction, impedance spectroscopy and dielectric relaxation of Li-doped ZnO-sprayed thin films
Crossref DOI link: https://doi.org/10.1007/s00339-019-2911-3
Published Online: 2019-08-12
Published Print: 2019-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Salah, Mohamed
Azizi, Samir
Boukhachem, Abdelwaheb
Khaldi, Chokri
Amlouk, Mosbah
Lamloumi, Jilani
Text and Data Mining valid from 2019-08-12
Version of Record valid from 2019-08-12
Article History
Received: 22 May 2019
Accepted: 6 August 2019
First Online: 12 August 2019