Effect of annealing temperature on properties of yttrium-doped ZnO thin films grown by radio-frequency magnetron sputtering
Crossref DOI link: https://doi.org/10.1007/s00339-019-3111-x
Published Online: 2019-11-06
Published Print: 2019-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shin, Johngeon
Cho, Shinho http://orcid.org/0000-0002-2849-188X
Text and Data Mining valid from 2019-11-06
Version of Record valid from 2019-11-06
Article History
Received: 19 July 2019
Accepted: 26 October 2019
First Online: 6 November 2019