Synthesis and characterization of Zn-incorporated TiO2 thin films: impact of crystallite size on X-ray line broadening and bandgap tuning
Crossref DOI link: https://doi.org/10.1007/s00339-019-3112-9
Published Online: 2019-11-07
Published Print: 2019-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Paul, Tapash Chandra http://orcid.org/0000-0001-6987-6594
Podder, Jiban
Text and Data Mining valid from 2019-11-07
Version of Record valid from 2019-11-07
Article History
Received: 17 August 2019
Accepted: 28 October 2019
First Online: 7 November 2019