An insight to the performance of vertical super-thin body (VSTB) FET in presence of interface traps and corresponding noise and RF characteristics
Crossref DOI link: https://doi.org/10.1007/s00339-019-3165-9
Published Online: 2019-11-26
Published Print: 2019-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Roy Barman, Kuheli
Baishya, Srimanta
Text and Data Mining valid from 2019-11-26
Version of Record valid from 2019-11-26
Article History
Received: 17 June 2019
Accepted: 19 November 2019
First Online: 26 November 2019