Application of fundamental parameter approach using integrated backscattering intensity for X-ray fluorescence analysis
Crossref DOI link: https://doi.org/10.1007/s00339-020-03493-7
Published Online: 2020-04-03
Published Print: 2020-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jin, Hak-Son
Ri, Chol
Jong, Yon-Song
Text and Data Mining valid from 2020-04-03
Version of Record valid from 2020-04-03
Article History
Received: 15 January 2020
Accepted: 23 March 2020
First Online: 3 April 2020