The evaluation of the current–voltage and capacitance–voltage-frequency measurements of Yb/p-Si Schottky diodes with a high zero-bias barrier height
Crossref DOI link: https://doi.org/10.1007/s00339-020-03662-8
Published Online: 2020-06-02
Published Print: 2020-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lapa, Havva Elif http://orcid.org/0000-0002-5706-4641
Güçlü, Çiğdem Şükriye
Aldemir, Durmuş Ali
Özdemir, Ahmet Faruk
Text and Data Mining valid from 2020-06-01
Version of Record valid from 2020-06-01
Article History
Received: 4 February 2020
Accepted: 21 May 2020
First Online: 2 June 2020