Study of the physical properties of quaternary Ge–As–Te–Pb thin films for technology applications
Crossref DOI link: https://doi.org/10.1007/s00339-020-03672-6
Published Online: 2020-06-11
Published Print: 2020-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ahmad, Mahmoud
Aly, K. A. http://orcid.org/0000-0002-0673-6217
Dahshan, A.
Soraya, M. M.
Saddeek, Yasser B.
Text and Data Mining valid from 2020-06-11
Version of Record valid from 2020-06-11
Article History
Received: 30 April 2020
Accepted: 26 May 2020
First Online: 11 June 2020