Significant effect of film thickness on morphology and third-order optical nonlinearities of Cd1−xZnxO semiconductor nanostructures for optoelectronics
Crossref DOI link: https://doi.org/10.1007/s00339-020-03771-4
Published Online: 2020-07-11
Published Print: 2020-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bairy, Raghavendra http://orcid.org/0000-0001-8254-1115
Jayarama, A.
Murari, M. S.
Text and Data Mining valid from 2020-07-11
Version of Record valid from 2020-07-11
Article History
Received: 12 April 2020
Accepted: 28 June 2020
First Online: 11 July 2020
Compliance with ethical standards
:
: The authors declare that there is no conflict of interest.