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Significant effect of film thickness on morphology and third-order optical nonlinearities of Cd1−xZnxO semiconductor nanostructures for optoelectronics

Crossref DOI link: https://doi.org/10.1007/s00339-020-03771-4

Published Online: 2020-07-11

Published Print: 2020-08

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Bairy, Raghavendra https://orcid.org/0000-0001-8254-1115
Jayarama, A.

Murari, M. S.
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Text and Data Mining valid from 2020-07-11

Version of Record valid from 2020-07-11
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Article History

Received: 12 April 2020

Accepted: 28 June 2020

First Online: 11 July 2020

Compliance with ethical standards

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: The authors declare that there is no conflict of interest.

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