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Thickness-dependent physical properties of sputtered V2O5 films and Ti/V2O5/n-Si Schottky barrier diode

Crossref DOI link: https://doi.org/10.1007/s00339-020-04023-1

Published Online: 2020-10-06

Published Print: 2020-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Kaya, Meltem Donmez https://orcid.org/0000-0002-6575-7632
Sertel, Buse Comert

Sonmez, Nihan Akin

Cakmak, Mehmet

Ozcelik, Suleyman
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Text and Data Mining valid from 2020-10-06

Version of Record valid from 2020-10-06
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Article History

Received: 18 June 2020

Accepted: 25 September 2020

First Online: 6 October 2020