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Single-event transient characteristics of vertical gate-all-around junctionless field-effect transistor on bulk substrate

Published Online: 2021-01-07

Published Print: 2021-02

Authors

Yoon, Young Jun https://orcid.org/0000-0001-8755-5057
Lee, Jae Sang

Kang, In Man

Kim, Dong-Seok
License Information

Text and Data Mining valid from 2021-01-07

Version of Record valid from 2021-01-07
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Article History

Received: 19 November 2020

Accepted: 23 December 2020

First Online: 7 January 2021

Compliance with ethical standards

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: The authors declare that they have no conflict of interests.

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