Analyzed electrical performance and induced interface passivation of fabricated Al/NTCDA/p-Si MIS–Schottky heterojunction
Crossref DOI link: https://doi.org/10.1007/s00339-020-3289-y
Published Online: 2020-01-18
Published Print: 2020-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nawar, Ahmed M.
Abd-Elsalam, Mohamed
El-Mahalawy, Ahmed M.
El-Nahass, M. M.
Text and Data Mining valid from 2020-01-18
Version of Record valid from 2020-01-18
Article History
Received: 23 September 2019
Accepted: 3 January 2020
First Online: 18 January 2020