Impact of temperature on analog/RF, linearity and reliability performance metrics of tunnel FET with ultra-thin source region
Crossref DOI link: https://doi.org/10.1007/s00339-021-04813-1
Published Online: 2021-08-16
Published Print: 2021-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Singh, Prabhat http://orcid.org/0000-0001-6441-4307
Yadav, Dharmendra Singh
Text and Data Mining valid from 2021-08-16
Version of Record valid from 2021-08-16
Article History
Received: 20 April 2021
Accepted: 29 July 2021
First Online: 16 August 2021