Effects of Rapid Thermal Annealing on the Structural, Optical, and Electrical Properties of Au/CuPc/n-Si (MPS)-type Schottky Barrier Diodes
Crossref DOI link: https://doi.org/10.1007/s00339-021-04945-4
Published Online: 2021-10-01
Published Print: 2021-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sekhar Reddy, P. R.
Janardhanam, V.
Rajagopal Reddy, V. http://orcid.org/0000-0002-0327-8425
Park, Min Hyuk
Choi, Chel-Jong
Text and Data Mining valid from 2021-10-01
Version of Record valid from 2021-10-01
Article History
Received: 27 April 2021
Accepted: 20 September 2021
First Online: 1 October 2021