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Voltage-frequency dependence of the complex dielectric and electric modulus and the determination of the interface-state density distribution from the capacitance-frequency measurements of Al/p-Si/Al and Al/V2O5/p-Si/Al structures

Crossref DOI link: https://doi.org/10.1007/s00339-024-07758-3

Published Online: 2024-08-21

Published Print: 2024-09

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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