Crossmark

Negative thermal expansion coefficient and amorphization in defective 4H-SiC

Crossref DOI link: https://doi.org/10.1007/s00339-024-07809-9

Published Online: 2024-09-24

Published Print: 2024-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Grome, Christopher A. https://orcid.org/0009-0001-9005-439X
Hossain, Zubaer
License Information

Text and Data Mining valid from 2024-09-24

Version of Record valid from 2024-09-24
More Information

Article History

Received: 9 February 2024

Accepted: 11 August 2024

First Online: 24 September 2024

Declarations

:

: The authors declare no Conflict of interest.