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Comparative investigation of Co, Fe, Ni ion and protons radiation damage in oxide optimized Si-MOS capacitive radiation sensor using Monte Carlo simulation

Crossref DOI link: https://doi.org/10.1007/s00339-024-08184-1

Published Online: 2024-12-23

Published Print: 2025-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Anjankar, Shubham https://orcid.org/0000-0002-1057-7343
Dhavse, Rasika

Yadav, Shivendra
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Text and Data Mining valid from 2024-12-23

Version of Record valid from 2024-12-23
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Article History

Received: 27 September 2024

Accepted: 15 December 2024

First Online: 23 December 2024

Declarations

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: It is declared that, there is no known conflict of interest regarding the work reported in this manuscript.

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