First principle defect study of MoSe2 field effect transistor
Crossref DOI link: https://doi.org/10.1007/s00340-015-6058-4
Published Online: 2015-02-26
Published Print: 2015-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ghosh, Bahniman
Kishor, Naval
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