Free charge carrier absorption in silicon at 800 nm
Crossref DOI link: https://doi.org/10.1007/s00340-015-6308-5
Published Online: 2016-03-11
Published Print: 2016-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Heisel, P. -C.
Ndebeka, W. I.
Neethling, P. H.
Paa, W.
Rohwer, E. G.
Steenkamp, C. M.
Stafast, H.
Text and Data Mining valid from 2016-03-01