Ab-initio determination of porous silicon refractive index confirmed by infrared transmittance measurements of an omnidirectional multilayer reflector
Crossref DOI link: https://doi.org/10.1007/s00340-018-6938-5
Published Online: 2018-03-30
Published Print: 2018-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Palavicini, Alessio
Wang, Chumin
Funding for this research was provided by:
CONACyT of Mexico (252943)
Text and Data Mining valid from 2018-03-30
Article History
Received: 27 May 2017
Accepted: 27 March 2018
First Online: 30 March 2018