Double-pass imaging background-oriented schlieren technique for focusing on measurement target
Crossref DOI link: https://doi.org/10.1007/s00348-023-03694-9
Published Online: 2023-08-27
Published Print: 2023-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hirose, Y.
Yamagishi, M.
Udagawa, S.
Inage, T.
Tagawa, Y.
Ota, M.
Text and Data Mining valid from 2023-08-27
Version of Record valid from 2023-08-27
Article History
Received: 10 March 2023
Revised: 22 July 2023
Accepted: 8 August 2023
First Online: 27 August 2023
Declarations
:
: Not applicable.