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Detection of defects in voltage-dependent resistors using stacked-block-based convolutional neural networks

Published Online: 2020-07-02

Published Print: 2021-06

Authors

Yang, Tiejun

Zhang, Tianshu

Huang, Lin http://orcid.org/0000-0002-2678-2085
Funding

Funding for this research was provided by:

National Natural Science Foundation of China (61941202)

Natural Science Foundation of Guangxi Province (2018GXNSFBA281081)

Guangxi Key Laboratory Fund of Embedded Technology and Intelligent System (2019-02-01, 2019-01-08)
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Text and Data Mining valid from 2020-07-02

Version of Record valid from 2020-07-02
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Article History

First Online: 2 July 2020

Document is current