Automatic image thresholding using Otsu’s method and entropy weighting scheme for surface defect detection
Crossref DOI link: https://doi.org/10.1007/s00500-017-2709-1
Published Online: 2017-07-14
Published Print: 2018-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Truong, Mai Thanh Nhat
Kim, Sanghoon
Funding for this research was provided by:
National Research Foundation of Korea (2015R1D1A1A01057518)
License valid from 2017-07-14