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A variable-level automated defect identification model based on machine learning

Crossref DOI link: https://doi.org/10.1007/s00500-019-03942-3

Published Online: 2019-03-23

Published Print: 2020-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Zhang, Yuwei https://orcid.org/0000-0002-4616-1067
Xing, Ying

Gong, Yunzhan

Jin, Dahai

Li, Honghui

Liu, Feng
Funding

Funding for this research was provided by:

National Natural Science Foundation of China (61702044)

National Natural Science Foundation of China (U1736110)

Fundamental Research Funds for the Central Universities (2017RC27)

National Key Research and Development Program of China (2016YFF0204002)
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Text and Data Mining valid from 2019-03-23
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Article History

First Online: 23 March 2019

Compliance with ethical standards

:

: The authors declare that they have no conflict of interest.

: This article does not contain any studies with human participants or animals performed by any of the authors.