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RETRACTED ARTICLE: Minimization of test time in system on chip using artificial intelligence-based test scheduling techniques

Published Online: 2019-01-23

Published Print: 2020-05

Authors

Chandrasekaran, Gokul

Periyasamy, Sakthivel

Panjappagounder Rajamanickam, Karthikeyan
License Information

Text and Data Mining valid from 2019-01-23

Version of Record valid from 2019-01-23
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Article History

Received: 15 October 2018

Accepted: 14 January 2019

First Online: 23 January 2019

Change Date: 18 July 2024

Change Type: Correction

Change Details: This article has been retracted. Please see the Retraction Notice for more detail:

Change Details: https://doi.org/10.1007/s00521-024-10107-3

Compliance with ethical standards

:

: There is no conflict of interest from the authors

Document is current