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Defect count prediction via metric-based convolutional neural network

Crossref DOI link: https://doi.org/10.1007/s00521-021-06158-5

Published Online: 2021-06-08

Published Print: 2021-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Nevendra, Meetesh

Singh, Pradeep https://orcid.org/0000-0002-2806-8432
License Information

Text and Data Mining valid from 2021-06-08

Version of Record valid from 2021-06-08
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Article History

Received: 27 May 2020

Accepted: 24 May 2021

First Online: 8 June 2021

Declarations

:

: The manuscript does not have any conflict of interest.