The plastic and creep characteristics of silicon microstructure at elevated temperature
Crossref DOI link: https://doi.org/10.1007/s00542-014-2184-x
Published Online: 2014-05-05
Published Print: 2015-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yao, Shaokang
Xu, Dehui
Xiong, Bin
Wang, Yuelin
Text and Data Mining valid from 2014-05-05
