Diagnosis of parametric defects in dual axis IC accelerometers
Crossref DOI link: https://doi.org/10.1007/s00542-014-2218-4
Published Online: 2014-05-22
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gómez-Pau, Álvaro
Balado, Luz
Figueras, Joan
Text and Data Mining valid from 2014-05-22
