Fabrication of AFM probe with CuO nanowire formed by stress-induced method
Crossref DOI link: https://doi.org/10.1007/s00542-014-2317-2
Published Online: 2014-09-11
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hosoi, Atsushi
Koto, Hisataka
Ju, Yang
Text and Data Mining valid from 2014-09-11