An accelerated thermal cycling test for RF-MEMS switches
Crossref DOI link: https://doi.org/10.1007/s00542-015-2780-4
Published Online: 2016-01-02
Published Print: 2016-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mulloni, V.
Sordo, G.
Margesin, B.
Text and Data Mining valid from 2016-01-02