Effect of structured parameters on the hot-carrier immunity of transparent gate recessed channel (TGRC) MOSFET
Crossref DOI link: https://doi.org/10.1007/s00542-016-2918-z
Published Online: 2016-04-25
Published Print: 2017-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kumar, Ajay
Gupta, Neha
Chaujar, Rishu
Text and Data Mining valid from 2016-04-25
