Electrostatic fringing-fields effects on the structural behavior of MEMS shallow arches
Crossref DOI link: https://doi.org/10.1007/s00542-016-2985-1
Published Online: 2016-05-25
Published Print: 2018-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ouakad, Hassen M.
Text and Data Mining valid from 2016-05-25