Performance investigation of heterogeneous gate dielectric-gate metal engineered–gate all around-tunnel FET for RF applications
Crossref DOI link: https://doi.org/10.1007/s00542-016-3143-5
Published Online: 2016-10-04
Published Print: 2017-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Madan, Jaya
Gupta, R. S.
Chaujar, Rishu
License valid from 2016-10-04
